IFC 4.3.1.0 (IFC4X3_ADD1) development

I1

Semantic definition

The (thermal) lower testing current limit in [x In], indicating that for currents lower than I1, the tripping time shall be longer than the associated tripping time, T2.

Referenced in
Pset_ProtectiveDeviceTrippingUnitTypeElectroMagnetic
Pset_ProtectiveDeviceTrippingUnitTypeThermal
Table 1ff277be-bc99-46d1-8126-9423dbdee3a8

Edit on Github


Is this page difficult to understand? Let us know!