IFC 4.3.1.0 (IFC4X3_ADD1) development

I2

Semantic definition

The (thermal) upper testing current limit in [x In], indicating that for currents larger than I2, the tripping time shall be shorter than the associated tripping time, T2.

Referenced in
Pset_ProtectiveDeviceTrippingUnitTypeElectroMagnetic
Pset_ProtectiveDeviceTrippingUnitTypeThermal
Table e4d5da6b-1ae6-4d94-a4f9-cedd685da854

Edit on Github


Is this page difficult to understand? Let us know!