IFC (IFC4X3_ADD1) development


Semantic definition

The lower electromagnetic testing current limit in [x In], indicating that for currents lower than I4, the tripping time shall be longer than the associated tripping time, T5, i.e. the device shall not trip instantaneous.

Referenced in
Table 32e8a27b-6fde-4d4e-a3c9-37224e75c968

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