IFC (IFC4X3_ADD1) development


Semantic definition

The lower electromagnetic testing current limit in [x In], indicating that for currents lower than I4, the tripping time shall be longer than the associated tripping time, T5, i.e. the device shall not trip instantaneous.

Referenced in
Table 3484870c-0d2a-4459-8e12-7f3be72c6624

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