7.4.4.57 Pset_ProtectiveDeviceTrippingUnitTypeElectroMagnetic

A list of the available types of electric magnetic tripping unit from which that required may be selected. These cover overload, none special, short circuit, motor protection and bi-metal tripping.

The (thermal) lower testing current limit in [x In], indicating that for currents lower than I1, the tripping time shall be longer than the associated tripping time, T2.

The (thermal) upper testing current limit in [x In], indicating that for currents larger than I2, the tripping time shall be shorter than the associated tripping time, T2.

The (thermal) testing time in [s] associated with the testing currents I1 and I2.

The ambient temperature at which the thermal current/time-curve associated with this protection device is defined.

The correction factor (typically measured as %/deg K) for adjusting the thermal current/time to an ambient temperature different from the value given by the defined temperature.

The lower electromagnetic testing current limit in [x In], indicating that for currents lower than I4, the tripping time shall be longer than the associated tripping time, T5, i.e. the device shall not trip instantaneous.

The upper electromagnetic testing current limit in [x In], indicating that for currents larger than I5, the tripping time shall be shorter than or equal to the associated tripping time, T5, i.e. the device shall trip instantaneous.

The electromagnetic testing time in [s] associated with the testing currents I4 and I5, i.e. electromagnetic tripping time

The designation of the trippingcurve given by the manufacturer. For a MCB the designation should be in accordance with the designations given in IEC 60898.