IFC 4.3.1.0 (IFC4X3_ADD1) development

I1

Semantic definition

The (thermal) lower testing current limit in [x In], indicating that for currents lower than I1, the tripping time shall be longer than the associated tripping time, T2.

Referenced in
Pset_ProtectiveDeviceTrippingUnitTypeElectroMagnetic
Pset_ProtectiveDeviceTrippingUnitTypeThermal
Table 5335f78a-9861-4411-a754-58067da5b5f6

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