Information on tripping units that are thermally tripped.
|Name||Property Type||Data Type||Description|
A list of the available types of thermal tripping unit from which that required may be selected.
The (thermal) lower testing current limit in [x In], indicating that for currents lower than I1, the tripping time shall be longer than the associated tripping time, T2.
The (thermal) upper testing current limit in [x In], indicating that for currents larger than I2, the tripping time shall be shorter than the associated tripping time, T2.
The (thermal) testing time in [s] associated with the testing currents I1 and I2.
The ambient temperature at which the thermal current/time-curve associated with this protection device is defined.
The correction factor (typically measured as %/deg K) for adjusting the thermal current/time to an ambient temperature different from the value given by the defined temperature.
The designation of the trippingcurve given by the manufacturer. For a MCB the designation should be in accordance with the designations given in IEC 60898.